排序方式： 共有27条查询结果，搜索用时 15 毫秒
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王亚明%贾德昌%周玉%雷廷权 《宇航材料工艺》2002,32(4):32-35,50
采用类似于粉末冶金工艺制备了Ba2Ti9O20/PTFE高频基片复合材料，通过DSC研究PTFE的结晶行为，SEM及三点弯曲法分析了组织结构特征及力学性能。结果表明。Ba2Ti9O20的加入提高了PTFE的结晶温度，其粒子均匀分散在PTFE树脂基体中，随其含量的增加，复合材料的抗弯强度，弹性模量单调升高，当其含量达到30％，（体积分数）时两项性能均达到峰值，分别为16．4MPa,4.6GPa。 相似文献
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刘岩%贾德昌%孟庆昌 《宇航材料工艺》2002,32(5):34-37
成功制备出了以非晶态SiO2为基体，以纳米SiC颗粒（n-SiCp)为增强体的n-SiCp/SiO2陶瓷基复合材料。n-SiCp的引入并示引起基体SiO2的晶化，而且对复合材料的力学性能的改善起到了重要的作用，同时，并未损害复合材料的抗热震性能。所制备的n-SiCp/SiO2复合材料的临界抗热震温差可以达到1200℃。 相似文献
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Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely,by hybridizing testing-effort with testing coverage under imperfect debugging,this paper proposes a new model named GMW-LO-ID.Under the assumption that the number of faults is proportional to the current number of detected faults,this model combines generalized modified Weibull(GMW)testing-effort function with logistic(LO)testing coverage function,and inherits GMW's amazing flexibility and LO's high fitting precision.Furthermore,the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models,which only consider one or two points of testing-effort,testing coverage and imperfect debugging. 相似文献
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